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1

A Comprehensive Review of Swarm Optimization Algorithms

Ab Wahab, Mohd Nadhir, Nefti-Meziani, Samia, Atyabi, Adham, Buiu, Catalin

Journal:

Year:

2015

Language:

english

File:

PDF, 1.25 MB

english, 2015

2

Edge current induced failure of semiconductor PN junction during operation in the breakdown region of electrical characteristic

V.V.N. Obreja, C. Codreanu, D. Poenar, O. Buiu

Journal:

Microelectronics Reliability

Year:

2011

Language:

english

File:

PDF, 793 KB

english, 2011

3

Extracting the relative dielectric constant for “high-κ layers” from CV measurements – Errors and error propagation

O. Buiu, S. Hall, O. Engstrom, B. Raeissi, M. Lemme, P.K. Hurley, K. Cherkaoui

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 133 KB

english, 2007

4

Optical and electrical characterization of hafnium oxide deposited by MOCVD

Y. Lu, O. Buiu, S. Hall, P. K. Hurley

Journal:

Microelectronics Reliability

Year:

2005

Language:

english

File:

PDF, 228 KB

english, 2005

5

The effect of hot electron current density on nMOSFET reliability

O. Buiu, S. Taylor, I.S. Al-Kofahi, C. Beech

Journal:

Microelectronics Reliability

Year:

1998

Language:

english

File:

PDF, 350 KB

english, 1998

6

Optical characterization of ion implantation in Si and Si/SiO2 structures: spectroellipsometric (SE) and second harmonic generation (SHG) results

O. Buiu, S. Taylor, L. Culiuc, M. Gartner, I. Cernica

Journal:

Microelectronics Reliability

Year:

1999

Language:

english

File:

PDF, 275 KB

english, 1999

7

Channel distribution of generated interface states in 0.35 μm LDD nMOSFET

O. Buiu, I.S. Al-Kofahi, S. Taylor, J. Ellis

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 111 KB

english, 2000

8

Surface leakage current related failure of power silicon devices operated at high junction temperature

K.I. Nuttall, O. Buiu, V.V.N. Obreja

Journal:

Microelectronics Reliability

Year:

2003

File:

PDF, 848 KB

2003

9

[IEEE Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 - Taiwan (5-8 July 2004)] Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) - Catastrophic failure of power silicon PN junctions at high temperature induced by the surface leakage reverse current

Obreja, V.V.N., Buiu, O., Nuttall, K.I., Codreanu, C., Sung, M.L., Pei, P.

Year:

2004

Language:

english

File:

PDF, 291 KB

english, 2004

10

Charge trapping and interface states in hydrogen annealed HfO2–Si structures

Y.V. Gomeniuk, A.N. Nazarov, Ya.N. Vovk, V.S. Lysenko, Yi Lu, O. Buiu, S. Hall, R.J. Potter, P. Chalker

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 261 KB

english, 2007

11

Tuneable electrical properties of hafnium aluminate gate dielectrics deposited by metal organic chemical vapour deposition

Y. Lu, O. Buiu, S. Hall, I.Z. Mitrovic, W. Davey, R.J. Potter, P.R. Chalker

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 303 KB

english, 2007

12

Electrical and structural properties of hafnium silicate thin films

I.Z. Mitrovic, O. Buiu, S. Hall, C. Bungey, T. Wagner, W. Davey, Y. Lu

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 322 KB

english, 2007

13

The influence of junction depth on short channel effects in vertical sidewall MOSFETs

Lizhe Tan, Octavian Buiu, Stephen Hall, Enrico Gili, Takashi Uchino, Peter Ashburn

Journal:

Solid-State Electronics

Year:

2008

Language:

english

File:

PDF, 805 KB

english, 2008

14

High-k-oxide/silicon interfaces characterized by capacitance frequency spectroscopy

B. Raeissi, J. Piscator, O. Engström, S. Hall, O. Buiu, M.C. Lemme, H.D.B. Gottlob, P.K. Hurley, K. Cherkaoui, H.J. Osten

Journal:

Solid-State Electronics

Year:

2008

Language:

english

File:

PDF, 350 KB

english, 2008

15

Charge trapping characterization of MOCVD HfO2/p-Si interfaces at cryogenic temperatures

I.P. Tyagulskyy, I.N. Osiyuk, V.S. Lysenko, A.N. Nazarov, S. Hall, O. Buiu, Y. Lu, R. Potter, P. Chalker

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 436 KB

english, 2007

16

Optical and electrical characterization of hafnium oxide deposited by liquid injection atomic layer deposition

P. Taechakumput, S. Taylor, O. Buiu, R.J. Potter, P.R. Chalker, A.C. Jones

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 428 KB

english, 2007

17

Navigation aids in the search for future high-k dielectrics: Physical and electrical trends

O. Engström, B. Raeissi, S. Hall, O. Buiu, M.C. Lemme, H.D.B. Gottlob, P.K. Hurley, K. Cherkaoui

Journal:

Solid-State Electronics

Year:

2007

Language:

english

File:

PDF, 229 KB

english, 2007

18

Improved sub-threshold slope in short-channel vertical MOSFETs using FILOX oxidation

M.M.A. Hakim, L. Tan, O. Buiu, W. Redman-White, S. Hall, P. Ashburn

Journal:

Solid-State Electronics

Year:

2009

Language:

english

File:

PDF, 1.16 MB

english, 2009

19

[IEEE 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. - Shangri-La's Rasa Sentosa Resort, Singapore (27 June-1July, 2005)] Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA 2005. - Semiconductor pn junction failure at operation near or in the breakdown region of the reverse I-V characteristic

Obreja, V.V.N., Codreanu, C., Poenar, D., Buiu, O.

Year:

2005

Language:

english

File:

PDF, 281 KB

english, 2005

20

[IEEE 2014 IEEE Global Engineering Education Conference (EDUCON) - Istanbul (2014.4.3-2014.4.5)] 2014 IEEE Global Engineering Education Conference (EDUCON) - Designing robotic avatars in Second Life - A tool to complement robotics education

Buiu, Catalin, Gansari, Mihai

Year:

2014

File:

PDF, 1.43 MB

2014

21

[IEEE 2014 6th International Conference on Electronics, Computers and Artificial Intelligence (ECAI) - Bucharest, Romania (2014.10.23-2014.10.25)] Proceedings of the 2014 6th International Conference on Electronics, Computers and Artificial Intelligence (ECAI) - Building a SLAM capable heterogeneous multi-robot system with a Kinect sensor

Gansari, Mihai, Buiu, Catalin

Year:

2014

Language:

english

File:

PDF, 593 KB

english, 2014

22

COMPLEX BEHAVIORS OF TELEOPERATED ROBOTIS

Buiu, Catalin, Dumitrache, Ioan, Mihai, Florin

Journal:

IFAC Proceedings Volumes

Year:

2002

Language:

english

File:

PDF, 137 KB

english, 2002

23

A CONVERSATIONAL MAN-ROBOT INTERFACE USED IN ROBOTICS

Buiu, Catalin, Dumitrache, Ioan, Dumitrascu, Alexandra

Journal:

IFAC Proceedings Volumes

Year:

2005

Language:

english

File:

PDF, 352 KB

english, 2005

24

An Online Collaborative Environment for Sharing Visual Culture

Cifuentes, Lauren, Stephen, Carpenter, Buiu, Sanser

Journal:

Journal of Visual Literacy

Year:

2006

Language:

english

File:

PDF, 1.04 MB

english, 2006

25

[IEEE 2017 9th International Conference on Electronics, Computers and Artificial Intelligence (ECAI) - Targoviste (2017.6.29-2017.7.1)] 2017 9th International Conference on Electronics, Computers and Artificial Intelligence (ECAI) - Modelling multi-robot interactions using a generic controller based on numerical P systems and ROS

Florea, Andrei George, Buiu, Catalin

Year:

2017

Language:

english

File:

PDF, 748 KB

english, 2017

26

An optimization design proposal of automated guided vehicles for mixed type transportation in hospital environments

González, Domingo, Romero, Luis, Espinosa, María del Mar, Domínguez, Manuel, Buiu, Catalin

Journal:

Year:

2017

Language:

english

File:

PDF, 8.41 MB

english, 2017

27

[IEEE 2019 22nd International Conference on Control Systems and Computer Science (CSCS) - Bucharest, Romania (2019.5.28-2019.5.30)] 2019 22nd International Conference on Control Systems and Computer Science (CSCS) - Sensor Fusion for Autonomous Drone Waypoint Navigation Using ROS and Numerical P Systems: A Critical Analysis of Its Advantages and Limitations

Florea, Andrei George, Buiu, Catalin

Year:

2019

Language:

english

File:

PDF, 139 KB

english, 2019

28

MobileNetV2 Ensemble for Cervical Precancerous Lesions Classification

Buiu, CÄtÄlin, DÄnÄilÄ, Vlad-RareÅ, RÄduÅ£Ä, Cristina Nicoleta

Journal:

Year:

2020

File:

PDF, 15.82 MB

2020

29

The base current and related 1/f noise for SiGe HBTs realized by SEG/NSEG technology on SOI and bulk substrates

N. Lukyanchikova, N. Garbar, A. Smolanka, M. Lokshin, S. Hall, O. Buiu, I.Z. Mitrovic, H.A.W. El Mubarek, P. Ashburn

Journal:

Materials Science in Semiconductor Processing

Year:

2006

Language:

english

File:

PDF, 246 KB

english, 2006

30

Low-temperature conductance measurements of surface states in HfO2–Si structures with different gate materials

Y. Gomeniuk, A. Nazarov, Ya. Vovk, Yi Lu, O. Buiu, S. Hall, J.K. Efavi, M.C. Lemme

Journal:

Materials Science in Semiconductor Processing

Year:

2006

Language:

english

File:

PDF, 178 KB

english, 2006

31

A software tool for modeling and simulation of numerical P systems

Catalin Buiu, Octavian Arsene, Corina Cipu, Monica Patrascu

Journal:

Year:

2011

Language:

english

File:

PDF, 908 KB

english, 2011

32

GSMBE growth and structural characterisation of SiGeC layers for HBT

J. Zhang, J.H. Neave, X.B. Li, P.F. Fewster, H.A.W. El Mubarek, P. Ashburn, I.Z. Mitrovic, O. Buiu, S. Hall

Journal:

Journal of Crystal Growth

Year:

2005

Language:

english

File:

PDF, 287 KB

english, 2005

33

Current transport mechanisms in (HfO2)x(SiO2) 1−x/SiO2gate stacks

I.Z. Mitrovic, Y. Lu, O. Buiu, S. Hall

Journal:

Microelectronic Engineering

Year:

2007

Language:

english

File:

PDF, 339 KB

english, 2007

34

Real-time observation of charging dynamics in hafnium silicate films using MOS capacitance transients

Y. Lu, S. Hall, O. Buiu, J.F. Zhang

Journal:

Microelectronic Engineering

Year:

2007

Language:

english

File:

PDF, 357 KB

english, 2007

35

Estimate of dielectric density using spectroscopic ellipsometry

W. Davey, O. Buiu, M. Werner, I.Z. Mitrovic, S. Hall, P. Chalker

Journal:

Microelectronic Engineering

Year:

2009

Language:

english

File:

PDF, 375 KB

english, 2009

36

Review of SiGe HBTs on SOI

I.Z. Mitrovic, O. Buiu, S. Hall, D.M. Bagnall, P. Ashburn

Journal:

Solid-State Electronics

Year:

2005

Language:

english

File:

PDF, 607 KB

english, 2005

37

Chemical and optical profiling of ultra thin high-k dielectrics on silicon

S. Bernardini, M. MacKenzie, O. Buiu, P. Bailey, T.C.Q. Noakes, W.M. Davey, B. Hamilton, S. Hall

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 317 KB

english, 2008

38

Production of large metallic clusters by thermal evaporation

O Buiu, J.L Leclerc, S.H Yan, A Munidradasa, R Murray, S Taylor

Journal:

Applied Surface Science

Year:

1999

Language:

english

File:

PDF, 777 KB

english, 1999

39

Genetic learning of fuzzy controllers

Ion Dumitrache, Cătălin Buiu

Journal:

Mathematics and Computers in Simulation

Year:

1999

Language:

english

File:

PDF, 359 KB

english, 1999

40

Tin dioxide sol–gel derived thin films deposited on porous silicon

Cornel Cobianu, Cristian Savaniu, Octavian Buiu, Dan Dascalu, Maria Zaharescu, Constanta Parlog, Albert van den Berg, Bela Pecz

Journal:

Sensors and Actuators B: Chemical

Year:

1997

Language:

english

File:

PDF, 285 KB

english, 1997

41

Recent developments in deca-nanometer vertical MOSFETs

S Hall, D Donaghy, O Buiu, E Gili, T Uchino, V.D Kunz, C.H de Groot, P Ashburn

Journal:

Microelectronic Engineering

Year:

2004

Language:

english

File:

PDF, 400 KB

english, 2004

42

Spectroellipsometric assessment of HfO2 thin films

O. Buiu, Y. Lu, I.Z. Mitrovic, S. Hall, P. Chalker, R.J. Potter

Journal:

Thin Solid Films

Year:

2006

Language:

english

File:

PDF, 422 KB

english, 2006

43

Investigation of optical and electronic properties of hafnium aluminate films deposited by Metal–Organic Chemical Vapour Deposition

O. Buiu, Y. Lu, S. Hall, I.Z. Mitrovic, R.J. Potter, P.R. Chalker

Journal:

Thin Solid Films

Year:

2007

Language:

english

File:

PDF, 505 KB

english, 2007

44

Ellipsometric analysis of mixed metal oxides thin films

O. Buiu, W. Davey, Y. Lu, I.Z. Mitrovic, S. Hall

Journal:

Thin Solid Films

Year:

2008

Language:

english

File:

PDF, 298 KB

english, 2008

45

[IEEE IEEE International Symposium on Industrial Electronics, 2005. ISIE 2005. - Dubrovnik, Croatia (June 20-23, 2005)] Proceedings of the IEEE International Symposium on Industrial Electronics, 2005. ISIE 2005. - Reverse Current Instability of Power Silicon Diodes (Thyristors) at High Temperature and the Junction Surface Leakage Current

Obreja, V.V.N., Codreanu, C., Nuttall, K.I., Buiu, O.

Year:

2005

Language:

english

File:

PDF, 201 KB

english, 2005

46

Implanted damage evolution in sequential annealed silicon

O. Buiu, M. Gartner, R. Plugaru, M. Dumitru

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

1994

Language:

english

File:

PDF, 396 KB

english, 1994

47

A software system for collaborative robotics applications and its application in particle swarm optimization implementations

Cristian I. Vasile, Cătălin Buiu

Journal:

Applied Soft Computing

Year:

2011

Language:

english

File:

PDF, 1.05 MB

english, 2011

48

Development of membrane controllers for mobile robots

Catalin Buiu, Cristian Vasile, Octavian Arsene

Journal:

Information Sciences

Year:

2012

Language:

english

File:

PDF, 1.38 MB

english, 2012

49

Radiation enhanced growth rates during plasma oxidation of silicon

O. Buiu, S. Taylor

Journal:

Thin Solid Films

Year:

1999

Language:

english

File:

PDF, 256 KB

english, 1999

50

Charge carrier lifetime modification in silicon by high energy H+ or He+ ion implantation

N.Q. Khánh, P. Tüttő, O. Buiu, E.N. Jároli, L.P. Bíró, A. Manuaba, J. Gyulai

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

1997

Language:

english

File:

PDF, 434 KB

english, 1997

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